Numéro |
J. Phys. IV France
Volume 129, October 2005
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Page(s) | 169 - 172 | |
DOI | https://doi.org/10.1051/jp4:2005129036 |
J. Phys. IV France 129 (2005) 169-172
DOI: 10.1051/jp4:2005129036
Planar differential interferometry of the magnetic field measurements
C. Tyszkiewicz and T. PustelnyDepartment of Optoelectronics, Institute of Physics, Silesian University of Technology, ul. Krzywoustego 2, Gliwice, Poland
Abstract
This paper presents a planar differential interferometer
which can be used to measure the magnetic field. Due to magnetic field
interaction the refractive index of the cover layer is changed for the TM
mode. In consequence, the propagation constant changes only for this mode,
and the phase difference between the TE and TM modes depends on the
intensity of the magnetic field. The influence of the optic and geometric
parameters of the presented interferometer on the phase difference between
varoius modes is discussed.
© EDP Sciences 2005