| Numéro |
J. Phys. IV France
Volume 125, June 2005
|
|
|---|---|---|
| Page(s) | 125 - 127 | |
| DOI | https://doi.org/10.1051/jp4:2005125029 | |
J. Phys. IV France 125 (2005) 125-127
DOI: 10.1051/jp4:2005125029
Elastic anisotropy, crystallographic orientation and texture measurement by photothermal interferometric microscopy
J. Jumel1, D. Rochais2 and F. Lepoutre31 LMT Cachan, 61 avenue du Président Wilson, 94235 Cachan Cedex, France
2 CEA Le Ripault, BP. 16, 37260 Monts, France
3 ONERA/DMSE/MECS, BP. 72, 29 Av. de la Division Leclerc, 92322 Châtillon Cedex, France
Abstract
Photothermal interferometric microscopy is used to determine the thermal diffusivity, elastic anisotropy and principal axis orientation of nickel superalloy single crystal samples. The inversion method is explained in details.
© EDP Sciences 2005