Real one-dimensional CDW formation assured by noise observations

Abstract
Narrow band noise (NBN) associated with the sliding motion of Charge density wave (CDW) is not so easy to measure in a bulk K _0.3MoO ₃, because of the quasi one-dimensional effect. Then, This study proposes a new technique of thin-film CDW (2-D) and nano-scale CDW (1-D) fabrication on a bulk sample to avoid the 3-D interaction, and to realize the 1-D features experimentally, by using H-ion beam irradiation and electron beam lithography. Consequently, the different a t the 1-D sample has been dramatically reduced in the relation within error 1.5%. Moreover, inclination of broad band noise (BBN) which is another noise generated at the time of CDW conduction almost disappeared in l-D sample.