J. Phys. IV France 03 (1993) C8-463-C8-466
SAXS study of coated porous silicasA. BENEDETTI1, S. CICCARIELLO2, F. PINNA3 and G. STRUKUL3
1 Dipartimento di Chimica-Fisica, Calle S. Marta DD2137, 30123 Venezia, Italy
2 Dipartimento di Fisica 'G. Galilei' and sez. INFM, via Manolo 8, 35131 Padova, Italy
3 Dipartimento di Chimica Industriale, Calle S. Marta DD2137, 30123 Venezia, Italy
The small-angle x-ray intensities scattered (SAXS) by four reversed phase silica (RPS) samples are analyzed. The RPS's have been obtained by coating two different porous silica supports with dimethyloctyl- and with dimethyloctadecyl-(chloro)silane. From the observed intensities it is possible to estimate the mean electron-densities of the films as well as the mean silica-surface per coating molecule.
© EDP Sciences 1993