J. Phys. IV France
Volume 104, March 2003
Page(s) 71 - 76

J. Phys. IV France
104 (2003) 71
DOI: 10.1051/jp4:200300032

A new magnetic type of X-PEEM

K. Yada1, M. Furudate2, K. Shinohara3, A. Ito4, Y. Yurimoto5 and M. Watanabe2

1  Tohken Co. Ltd., 2-27-7 Tamagawa, Chofu, Tokyo, Japan
2  Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Japan
3  University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan
4  Tokai University, 1117 Kitakaname, Hiratuka, Japan
5  Tokyo Institute of Technology, 2-12-1 Ohokayama, Meguro-ku, Tokyo, Japan

We construct a magnetic type of transmission photoemission electron microscope (PEEM) which is similar in principle to a magnetic type of transmission X-PEEM called zooming tube developed by Hamamatsu Photonics. We aim to realize higher resolution and much remarkable compactness by optimized electron optical designs. The objective has tens parameters, Cs=8mm, Cc=7mm, fo=8mm, potential for photocathode $V_{\rm p}=-
15$ -l6kV and electric field strength in front of photocathode 5000V/mm. The microscope is tested by various operation modes : TEM, X-PEEM (X-rays from Au-target and from BL12A at PF), UV-PEEM (He-Cd laser). A Chevron type of MCP is mainly used as the image detector besides a fluorescent screen. TEM mode shows fairly high resolution better than 40nm. The resolutions of X-PEEM and UV-PEEM deteriorate as compared with TEM case showing a level of 200nm. It is proved with biological samples that the microscope has wavelength-scan capability as expected, showing fairly high image quality.

© EDP Sciences 2003