Numéro
J. Phys. IV France
Volume 104, March 2003
Page(s) 77 - 80
DOI https://doi.org/10.1051/jp4:200300033


J. Phys. IV France
104 (2003) 77
DOI: 10.1051/jp4:200300033

The photoelectron emission microscopy station at SRRC

D.-H. Wei1, Y.-J. Hsu1, G.-C. Yin1, Y.-S. Wu1 and J.-C. Jan2

1  Synchrotron Radiation Research Center, No. 1 R&D Road VI, Hsinchu 300, Taiwan
2  Department of Physics, Tamkang University, Tamsui 251, Taiwan


Abstract
A full-field imaging microscopy station based on photoelectron emission was established at the elliptical undulator (EPU) beamline at SRRC. The PEEM optics adapted in this System is an OMICRN FOCUS-IS PEEM with LN 2 cooling. Initial tests using mercury light source and synchrotron radiation have achieved 0.1 $\mu$m/0.18 $\mu$m spatial resolution, respectively, and the sample temperature can be cooled down to approximately 150 K. With energy ranging from 60 eV~1400 eV and linear/circular polarized x-rays, SRRC PEEM station can be used to explore micro-area absorption spectroscopy study and various contrast imaging on ultra-thin films and micro-structures. In this report, we will present the performance and recent activities of the PEEM station.



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