Numéro
J. Phys. IV France
Volume 12, Numéro 9, November 2002
Page(s) 325 - 326
DOI http://dx.doi.org/10.1051/jp4:20020429


J. Phys. IV France
12 (2002) Pr9-325
DOI: 10.1051/jp4:20020429

Real one-dimensional CDW formation assured by noise observations

K. Morikawa1, H. Kubota1, K. Nakamura2 and A. Nakada1

1  Kumamoto University, Kumamoto, Japan
2  Kumamoto Technology and Industry Foundation, Kumamoto, Japan


Abstract
Narrow band noise (NBN) associated with the sliding motion of Charge density wave (CDW) is not so easy to measure in a bulk K 0.3MoO 3, because of the quasi one-dimensional effect. Then, This study proposes a new technique of thin-film CDW (2-D) and nano-scale CDW (1-D) fabrication on a bulk sample to avoid the 3-D interaction, and to realize the 1-D features experimentally, by using H-ion beam irradiation and electron beam lithography. Consequently, the different a t the 1-D sample has been dramatically reduced in the relation within error 1.5%. Moreover, inclination of broad band noise (BBN) which is another noise generated at the time of CDW conduction almost disappeared in l-D sample.



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