J. Phys. IV France
Volume 12, Numéro 3, May 2002
Page(s) 187 - 190

J. Phys. IV France
12 (2002) Pr3-187
DOI: 10.1051/jp420020065

Complete microwave characterization at 36 GHz of YBaCuO thin films deposited on MgO substrates. Influence of the substrate preparation

M. Achani1, N. Bourzgui1, J.-C. Carru1, A.F. Dégardin2, A. Gensbittel11 and A.J. Kreisler2

1  IEMN, UMR 8520 du CNRS, Université Lille 1, BP. 69, 59652 Villeneuve-d'Ascq cedex, France
2  LGEP, Supélec, Universités Paris 6 et 11, UMR 8507 du CNRS, Plateau de Moulon, 91190 Gif-sur-Yvette, France

This paper deals with the determination of $\lambda$ and Z s of YBa 2Cu 3O $_{7-\delta}$ thin films deposited on MgO singlecrystals, from 36 GHz resonant conical cavity measurements performed in the 25 K to 300 K temperature range. The results are discussed in relation with DC electrical transport properties of the films and also with substrate preparation prior to YBaCuO deposition.

© EDP Sciences 2002