Complete microwave characterization at 36 GHz of YBaCuO thin films deposited on MgO substrates. Influence of the substrate preparation

M. Achani; N. Bourzgui; J.-C. Carru; A.F. Dégardin; A. Gensbittel1; A.J. Kreisler

doi:doi:10.1051/jp420020065

Numéro		J. Phys. IV France Volume 12, Numéro 3, May 2002


Page(s)		187 - 190
DOI		https://doi.org/10.1051/jp420020065

J. Phys. IV France 12 (2002) Pr3-187
DOI: 10.1051/jp420020065

Complete microwave characterization at 36 GHz of YBaCuO thin films deposited on MgO substrates. Influence of the substrate preparation

M. Achani¹, N. Bourzgui¹, J.-C. Carru¹, A.F. Dégardin², A. Gensbittel1¹ and A.J. Kreisler²

¹ IEMN, UMR 8520 du CNRS, Université Lille 1, BP. 69, 59652 Villeneuve-d'Ascq cedex, France
² LGEP, Supélec, Universités Paris 6 et 11, UMR 8507 du CNRS, Plateau de Moulon, 91190 Gif-sur-Yvette, France

Abstract
This paper deals with the determination of $\lambda$ and Z _s of YBa ₂Cu ₃O $_{7-\delta}$ thin films deposited on MgO singlecrystals, from 36 GHz resonant conical cavity measurements performed in the 25 K to 300 K temperature range. The results are discussed in relation with DC electrical transport properties of the films and also with substrate preparation prior to YBaCuO deposition.