Issue
J. Phys. IV France
Volume 129, October 2005
Page(s) 253 - 257
DOI https://doi.org/10.1051/jp4:2005129052


J. Phys. IV France 129 (2005) 253-257

DOI: 10.1051/jp4:2005129052

The method of the analysis of thermal properties of layered structure with use of photoacoustic technique in pulse modulation mode

Z. Suszynski and R. Duer

Technical University of Koszalin, Sniadeckich 2, 75-453 Koszalin, Poland


Abstract
This paper exhibits the possibility of simultaneous detection of thermal non-uniformity in muliti-layer semiconductor structure and the analysis of the thermal properties of non-uniformities using photo-acoustic method in pulse excitations mode. The photo-acoustic method, besides many advantages, is characterized by high linear distortions of the measured signal. The linear distortions are introduced by each element of the measurement set-up. Classical methods of linear distortions elimination for example an inverse filtration in time domain need the transmittance of the measurement set-up to be well known. In the case of photo-acoustic measurement this condition can not be fulfill due to unknown transmittance of photo-acoustic phenomenon.



© EDP Sciences 2005

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.