Numéro |
J. Phys. IV France
Volume 126, June 2005
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Page(s) | 85 - 88 | |
DOI | https://doi.org/10.1051/jp4:2005126018 |
J. Phys. IV France 126 (2005) 85-88
DOI: 10.1051/jp4:2005126018
ITO-based electrode: A promising candidate for the growth of piezoelectric thin films
V. Bornand and Ph. PapetLaboratoire de Physicochimie de la Matière Condensée, LPMC UMR CNRS 5617, UM II, Place E. Bataillon, C.C. 003, 34095 Montpellier Cedex 5, France
Abstract
In many ways, interfaces and surfaces dominate the
behavior of thin films and multilayered devices. The critical nature that
the interfaces play on numerous physical properties has stimulated
significant effort to both understand such behavior and develop novel and
potentially useful nanoscale systems. In particular, the use of suitable
buffer layers has been shown to allow the control of nucleation and growth
processes and, thus, the fabrication of a very wide range of nanostructured
materials. This paper briefly overviews the relevant experimental work
performed at the LPMC and related to piezoelectric thin films. Particular
emphasis is given to In2O3:Sn oxide as an interesting conductive
electrode / buffer layer for the growth of various piezoelectric compounds
including LiNbO3 (LN), Pb(Zr0,52Ti0,48)O3 (PZT), ZnO.
© EDP Sciences 2005