| Numéro |
J. Phys. IV France
Volume 01, Numéro C6, Décembre 1991
Beam Injection Assessment of Defects in Semiconductors2nd International Workshop |
|
|---|---|---|
| Page(s) | C6-71 - C6-74 | |
| DOI | https://doi.org/10.1051/jp4:1991612 | |
Beam Injection Assessment of Defects in Semiconductors
2nd International Workshop
J. Phys. IV France 01 (1991) C6-71-C6-74
DOI: 10.1051/jp4:1991612
Laboratoire de Physique des Matériaux, 1 Place A. Briand, CNRS, Bellevue, F-92195 Meudon Cedex, France
© EDP Sciences 1991
2nd International Workshop
J. Phys. IV France 01 (1991) C6-71-C6-74
DOI: 10.1051/jp4:1991612
INFLUENCE OF THE INJECTION ON THE ELECTRON-BEAM INDUCED CURRENT COLLECTION EFFICIENCY
D.E. MEKKI and R.J. TARENTOLaboratoire de Physique des Matériaux, 1 Place A. Briand, CNRS, Bellevue, F-92195 Meudon Cedex, France
Without abstract
© EDP Sciences 1991
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