Journal de Physique IV

On the use of the modulated reflectance microscopy in the study of laser diode facets : detection of surface defects

A.M. Mansanares, J. P. Roger, D. Fournier and A.C. Boccara

J. Phys. IV France, 04 C7 (1994) C7-207-C7-210

DOI: 10.1051/jp4:1994750

A.M. Mansanares

J. P. Roger

D. Fournier

A.C. Boccara

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