| Numéro |
J. Phys. IV France
Volume 132, March 2006
|
|
|---|---|---|
| Page(s) | 237 - 241 | |
| DOI | https://doi.org/10.1051/jp4:2006132045 | |
| Publié en ligne | 11 mars 2006 | |
10th International Conference on the Formation of Semiconductor Interfaces
C. Girardeaux, et al.
J. Phys. IV France 132 (2006) 237-241
DOI: 10.1051/jp4:2006132045
L2MP-CNRS UMR 6137, ISEN-Toulon, Maison des Technologies, Place G. Pompidou, 83000 Toulon, France
© EDP Sciences 2006
C. Girardeaux, et al.
J. Phys. IV France 132 (2006) 237-241
DOI: 10.1051/jp4:2006132045
Nano-domains segmentation on AFM images
X. Luciani, L. Patrone and P. CourmontagneL2MP-CNRS UMR 6137, ISEN-Toulon, Maison des Technologies, Place G. Pompidou, 83000 Toulon, France
Abstract
The goal of this article is to present a new automatic processing
allowing a segmentation of AFM images with the aim of obtaining with
precision the dimensions of nano-domains. The proposed treatment is
based on the wedding of the multiresolution analysis with a
thresholding method. Results obtained on real data are proposed.
© EDP Sciences 2006