J. Phys. IV France
Volume 132, March 2006
Page(s) 237 - 241
Publié en ligne 11 mars 2006
10th International Conference on the Formation of Semiconductor Interfaces
C. Girardeaux, et al.
J. Phys. IV France 132 (2006) 237-241

DOI: 10.1051/jp4:2006132045

Nano-domains segmentation on AFM images

X. Luciani, L. Patrone and P. Courmontagne

L2MP-CNRS UMR 6137, ISEN-Toulon, Maison des Technologies, Place G. Pompidou, 83000 Toulon, France

The goal of this article is to present a new automatic processing allowing a segmentation of AFM images with the aim of obtaining with precision the dimensions of nano-domains. The proposed treatment is based on the wedding of the multiresolution analysis with a thresholding method. Results obtained on real data are proposed.

© EDP Sciences 2006