Investigations by X-ray topography of quartz and langasite resonators

I. Mateescu; B. Capelle; J. Detaint; G. Johnson; E. Tsoi; C. Bran

doi:doi:10.1051/jp4:2005126001

Numéro		J. Phys. IV France Volume 126, June 2005


Page(s)		3 - 6
DOI		https://doi.org/10.1051/jp4:2005126001

J. Phys. IV France 126 (2005) 3-6
DOI: 10.1051/jp4:2005126001

Investigations by X-ray topography of quartz and langasite resonators

I. Mateescu¹, B. Capelle², J. Detaint², G. Johnson³, E. Tsoi⁴ and C. Bran¹

¹ National Institute of Materials Physics, PO Box MG-7, Bucharest, Romania
² University "Pierre et Marie Curie", 4 place Jussieu, 75252 Paris, France
³ Sawyer Research Products, 35400 Lakeland Blvd., Eastlake, Ohio 44095, USA
⁴ Institute of Microelectronics "Demokritos", 15310 Ag.Paraskevi, Athens, Greece

Abstract
This paper presents the results of the X-ray topography investigations of mass-loading influence on electrical parameters of AT-cut quartz resonators and Y-cut langasite resonators. This study reveals that the mass-loading effect on electrical parameters of Y-cut langasite resonators is smaller than in the case of AT-cut quartz resonators. The results of the X-ray topography investigations are in good agreement with electrical measurements.