| Numéro |
J. Phys. IV France
Volume 125, June 2005
|
|
|---|---|---|
| Page(s) | 431 - 433 | |
| DOI | https://doi.org/10.1051/jp4:2005125101 | |
J. Phys. IV France 125 (2005) 431-433
DOI: 10.1051/jp4:2005125101
Investigation of the thermal diffusivity of thick film NTC layers obtained with the photoacoustic method
O.A. Aleksic1, P.M. Nikolic1, D. Lukovic1, S. Savic1, D. Vasiljevic-Radovic2, K. Radulovic1, L. Lukic3, A. Bojicic1 and D. Urosevic11 Institute of Technical Sciences, SASA, Knez Mihailova 35/IV, 11000 Belgrade, Serbia
2 IHTM - Institute of Microelectronic Technologies and Single Crystals, Njegoseva 12, 11000 Belgrade, Serbia
3 IRITEL, Batajnicki put 23, 11000 Belgrade, Serbia
Abstract
The thermal diffusivity of thick NTC layers based on a metal oxide powder mixture was measured at room temperature by the photoacoustic (PA) frequency transmission technique. The experimental PA amplitude and phase diagrams were numerically analyzed and the thermal diffusivity and electron transport parameters were calculated.
© EDP Sciences 2005