Numéro
J. Phys. IV France
Volume 125, June 2005
Page(s) 145 - 147
DOI https://doi.org/10.1051/jp4:2005125033


J. Phys. IV France 125 (2005) 145-147

DOI: 10.1051/jp4:2005125033

Time-resolved photothermal deflection measurements of thermophysical properties of solid materials with step optical excitation

J. Zhou, J. Zhao and J. Shen

National Research Council of Canada, Institute for Fuel Cell Innovation, 3250 East Mall, Vancouver, BC V6T 1W5, Canada


Abstract
Thermal properties of solid samples have been measured using recently developed time-resolved photothermal deflection spectrometry with step optical excitation. Thermal diffusivity can be measured directly, and thermal effusivity may be obtained by using a reference sample. Consequently, the thermal conductivity and the unit volume specific heat of a sample can be deduced from the measured thermal diffusivity and effusivity. The experimental results are in good agreement with literature values, indicating the time-resolved photothermal deflection spectrometry with step optical excitation is a very rigorous method in measuring thermophysical properties of solid materials.



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