J. Phys. IV France
Volume 118, November 2004
Page(s) 343 - 350

J. Phys. IV France 118 (2004) 343-350

DOI: 10.1051/jp4:2004118040

X-ray diffraction and microscopy investigations of structural inhomogeneities in NiMnSb crystallised from the melt

O. Monnereau1, F. Guinneton1, L.Tortet1, A.Garnier1, R. Notonier2, M. Cernea1, 3, S.A Manea3 and C. Grigorescu4

1  Madirel, Université de Provence, Marseille, France
2  Service commun de Microscopie, Université de Provence, Marseille, France
3  National Institut for Materials Physics, Bucharest, Romania
4  National Institut for Optoelectronics, Bucharest, Romania

Our present work investigates the structural properties of bulk NiMnSb prepared by growth from the melt, using various thermal regimes. We studied the compositional behaviour of the polycrystalline material obtained from stoichiometric 1:1:1 and respectively off-stoichiometric melts. The latter samples were grown with Mn excess up to 10% and respectively Ni deficiency between 2 and 10%. The X-ray diffraction and the Scanning electron microscopy complement each other in the characterisation of the phases occurring in the samples. The synthesis of NiMnSb starting from an initially stoichiometric mixture associated with a thermal treatment presenting plateaus gives the best results. Also, it seems that the presence of an excess of Mn is not sufficient to prevent the occurrence of the NiSb stray phase.

© EDP Sciences 2004