Numéro |
J. Phys. IV France
Volume 118, November 2004
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Page(s) | 165 - 171 | |
DOI | https://doi.org/10.1051/jp4:2004118020 |
J. Phys. IV France 118 (2004) 165-171
DOI: 10.1051/jp4:2004118020
Sodium doped lanthanum manganites thin films: Influence of the oxygen content on the structural parameters
I. Alessandri1, E. Bontempi1, L. Sangaletti2, S. Pagliara2, L. Malavasi3, F. Parmigiani2, G. Flor3 and L. E. Depero11 INSTM and Laboratorio di Strutturistica Chimica, Università di Brescia, via Branze 38, 25123, Brescia (Italy)
2 INFM and Dipartimento di Fisica, Università Cattolica del Sacro Cuore, via Musei 41, 25121, Brescia (Italy)
3 INSTM and Dipartimento di Chimica-Fisica “M.Rolla", Università di Pavia, v.le Taramelli 16, 27100, Pavia (Italy)
Abstract
We report the structural characterisation of La
Na
MnO
thin films deposited by Rf-magnetron sputtering onto SrTiO3 (100) single crystal substrates. In particular, we focussed our attention on a series of samples annealed at different pO2, ranging from 1 to 10-6 atm. XRD and microRaman data show an expansion of the perovskite lattice for samples annealed in reducing conditions. This results agree with general manganite gas-solid equilibrium involving the formation of Mn4+as the oxygen content increases. For pO
atm the structure rearranges because of the increasing the oxygen vacancies and the volume of the unit cell shrinks.
© EDP Sciences 2004