J. Phys. IV France
Volume 118, November 2004
Page(s) 119 - 125

J. Phys. IV France 118 (2004) 119-125

DOI: 10.1051/jp4:2004118014

Étude structurale par rayonnement synchrotron de superréseaux d'oxydes pérovskites

M. Nemoz1, E. Dooryhee1, J.-L. Hodeau1 et C. Dubourdieu2

1  Laboratoire de Cristallographie du CNRS, BP. 166, 38042 Grenoble Cedex 09, France
2  LMGP, UMR 5628, ENSPG-INPG, BP. 46, 38402 St Martin d'Hères, France

Perovskite oxides are analyzed by using high resolution synchrotron radiation diffraction. The diffraction profiles are fitted, taking into account the structural and chemical disorders which depart from the ideal defect-free superlattice. Two types of superlattices, (BaTiO3/SrTiO3)15 and (La0.7Sr0.3MnO3/SrTiO3)15, are synthesized by metal-organic chemical vapor deposition (MOCVD) on $<\!{\it001}\!>$ oriented Nb-doped SrTiO3 substrates. High-angle diffraction data show the excellent crystallinity and epitaxy of the films. For the (BaTiO3/SrTiO3)n multilayers we observe a pseudo tetragonal symmetry with no difference between a and b axes, and they present a significant strontium/baryum interdiffusion. The (La0.7Sr0.3MnO3/SrTiO3)$_{\rm n}$ multilayers and their substrates almost have the same a=b parameter. Along the c axis, La0.7Sr0.3MnO3 and SrTiO3 have different lattice parameters. The crystallographic coherence of the stacking is higher in these samples.

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