Small-angle x-ray scattering with the new NanoSTAR-U principles & applications

Materials Center Leoben & Erich-Schmid-Institute, Jahnstrasse 12, 8700 Leoben, Austria

Abstract

Nanostructure investigation using x-ray scattering makes it necessary to detect the signal in the immediate vicinity of the primary beam. With the recently (in cooperation with Bruker AXS, Erich- Schmid-Institute & University of Aarhus) developed “NanoSTAR-U” this is possible much faster and much more accurate than it was before. It is based on a combination of latest x-ray optics technology (Göbel mirrors) with precisely machined mechanics (optical bench with pinhole collimators, sample changer and primary beam stop) and a two dimensional detector (HI-STAR). The control of the system and the data evaluation is performed by a specially developed powerful software package running under Windows (SAXS NT). The main features of this instrument are high resolution up to 1000 Å in SAXS configuration, up to 2Θ = 40° in WAXS configuration, automatized sample holder and reference sample holder stage, x-ray “nanography” for inhomogeneous or small samples, sample stages for all kind of samples with the possibility of heating and/or cooling, the possibility to put the samples under various athmospheric conditions, a background-free real-time 2D-detector and a user-friendly software for controlling and automatizing all measurement tasks. Results on polymeric and biological materials are dicussed.