| Numéro |
J. Phys. IV France
Volume 112, October 2003
|
|
|---|---|---|
| Page(s) | 693 - 696 | |
| DOI | https://doi.org/10.1051/jp4:2003977 | |
J. Phys. IV France 112 (2003) 693
DOI: 10.1051/jp4:2003977
Structure studies of the R-phase using the X-ray and electron diffraction method
T. Goryczka and H. MorawiecUniversity of Silesia, Institute of Physics and Chemistry of Metals, Bankowa 12, 40-006 Katowice, Poland
Abstract
The R-phase was induced in polycrystalline 50.6at% Ni-Ti and 51.2at% Ni-Ti alloys by deformation
of
and annealing at 350°C for 70 hours. This procedure allowed for a good
separation of transformations:
and
. The X-ray diffraction patterns
were refined with Rietveld method for three structure models of the following space groups:
P3,
P-3 and
P31m. The atomic positions were calculated from the Patterson maps determined
from the LeBail method. The comparable lowest value of reliability factors was obtained from the
Rietveld refinement for
P3 and
P-3 space groups. Electron diffraction patterns registered
for basics zones were compared with kinematically calculated models. Profile line analysis was done
in rows with significant differences. All results supported the
P-3 model.
© EDP Sciences 2003