| Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 623 - 626 | |
| DOI | https://doi.org/10.1051/jp4:20030157 | |
J. Phys. IV France 104 (2003) 623
DOI: 10.1051/jp4:20030157
Cluster analysis of soft X-ray spectromicroscopy data
C. Jacobsen1, M. Feser1, M. Lerotic1, S. Vogt2, J. Maser2 and T. Schäfer31 Department of Physics and Astronomy, SUNY Stony Brook, U.S.A.
2 Advanced Photon Source, Argonne National Laboratory, Argonne, IL, U.S.A.
3 Forschungszentrum Karlsruhe GmbH, 76021 Karlsruhe, Germany
Abstract
We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster
analysis or pattern récognition analysis of soft x-ray spectromicroscopy data. Cluster
analysis provides a method to group régions with common spectral features even if no
prior knowledge of their spectra is available, such as in biology or environmental science.
© EDP Sciences 2003