J. Phys. IV France
Volume 104, March 2003
|Page(s)||623 - 626|
J. Phys. IV France 104 (2003) 623
Cluster analysis of soft X-ray spectromicroscopy dataC. Jacobsen1, M. Feser1, M. Lerotic1, S. Vogt2, J. Maser2 and T. Schäfer3
1 Department of Physics and Astronomy, SUNY Stony Brook, U.S.A.
2 Advanced Photon Source, Argonne National Laboratory, Argonne, IL, U.S.A.
3 Forschungszentrum Karlsruhe GmbH, 76021 Karlsruhe, Germany
We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern récognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group régions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.
© EDP Sciences 2003