| Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 557 - 561 | |
| DOI | https://doi.org/10.1051/jp4:20030143 | |
J. Phys. IV France 104 (2003) 557
DOI: 10.1051/jp4:20030143
X-ray microscopy by phase-retrieval methods at the advanced light source
M.R. Howells1, H. Chapman2, S. Hau-Riege2, H. He1, S. Marchesini1, J. Spence1, 3 and U. Weierstall31 Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A.
2 Lawrence Ln/ermore National Laboratory, Livermore, CA 94550, U.S.A.
3 Department of Physics and Astronomy, Arizona state University, Tempe, AZ 85287, U.S.A.
Abstract
We report our experiments in soft x-ray coherent diffraction leading to reconstructed images via phase retrieval methods.
We describe the history and principles of the method and the technical Systems we have used to implement it. The main requirement
is to have a sufficiently isolated sample.
© EDP Sciences 2003