| Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 551 - 556 | |
| DOI | https://doi.org/10.1051/jp4:20030142 | |
J. Phys. IV France 104 (2003) 551
DOI: 10.1051/jp4:20030142
Optical holography in the hard X-ray domain
N. Watanabe1, H. Yokosuka1, T. Ohigashi1, H. Takano2, A. Takeuchi2, Y. Suzuki2 and S. Aoki11 Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
2 SPring-8, Mikazuki, Hyogo 679-5198, Japan
Abstract
Present status of our developments of x-ray holographie microscopes at SPring-8 BL20XU is described.
A combination of the x-ray undulator and a zone plate enabled us to make a coherent x-ray source of around 0.1
m
size. Using this secondary source, two types of x-ray holographie microscopes were investigated. First, a Gabor
microscope in point-projection geometry was tested. A tantalum 0. 2 llm line-and-space pattern could be resolved.
Second, using a zone plate as a beam splitter, a Fourier transform holographie microscope was tested. A tantalum
0.2
m line-and-space pattern could be observed. Polystyrene beads of 2.8
m and 0.8
m in diameter could be
observed. In Fourier transform holography, a reconstructed image of a specimen that is located out of the plane of
the reference source is blurred. Numerical focusing of such an x-ray hologram could be successfully demonstrated.
© EDP Sciences 2003