Numéro |
J. Phys. IV France
Volume 104, March 2003
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Page(s) | 453 - 458 | |
DOI | https://doi.org/10.1051/jp4:20030121 |
J. Phys. IV France 104 (2003) 453
DOI: 10.1051/jp4:20030121
Chemical, electronic and magnetic properties of surfaces and interfaces probed with X-ray microscopes at ELETTRA
M. KiskinovaSincrotrone Trieste, Area Science Park, Basovizza, 34012 Trieste, Italy
Abstract
Selected results obtained with the microscopes at ELETTRA are used to present recent achievements of
photoelectron spectromicroseopy in identification of sub-micron area chemical phases at the surface and near surface
regions of various materials. The Systems that are reported include anisotropy of the oxide growth on Ru(0001), mass
transport of the surface species during surface reactions, interfacial reactions and band-bending, and imaging of magnetic
domains with elemental specificity. The lateral variations in the chemical state of the interface constituents, a result of
a
defective structure, chemical reactions or mass transport on the local interfacial properties are briefly discussed.
© EDP Sciences 2003