J. Phys. IV France
Volume 104, March 2003
|Page(s)||373 - 376|
J. Phys. IV France 104 (2003) 373
XPEEM valence state imaging of mineral micro-intergrowths with a spatial resolution of 100 nmA.D. Smith1, P.F. Schofield2, A. Scholl3, R.A.D. Pattrick4 and J.C. Bridges1
1 CLRC-Daresbury Laboratoly, Warrington, Cheshire WA4 4AD, U.K.
2 Department of Mineralogy, Natural History Museum, Cromwell Road, London SW7 5BD, U.K.
3 Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A.
4 Department of Earth Sciences, The University of Manchester, Oxford Road, Manchester M13 9PL, U.K.
The crystal chemistry and textural relationships of minerals hold a vast amount of information relating to the formation, history and stability of natural materials. The application of soft X-ray spectroscopy to mineralogical material has revealed that 2p (L 2,3) spectra provide a sensitive fingerprint of the electronic states of 3d metals. In bulk powdered samples much of the textural and microstructural information is lost, but the area-selectivity capability of X-ray Photo-Emission Electron Microscopy (XPEEM) provides the ability to obtain valence state information from mineral intergrowths with a submicron spatial resolution.
© EDP Sciences 2003