Numéro |
J. Phys. IV France
Volume 104, March 2003
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|
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Page(s) | 359 - 364 | |
DOI | https://doi.org/10.1051/jp4:20030100 |
J. Phys. IV France 104 (2003) 359
DOI: 10.1051/jp4:20030100
Microanalysis and imaging capabilities of synchrotron infrared microscopy
P. DumasLURE, bâtiment 209D, Centre Universitaire Paris-Sud, 91898 Orsay cedex, France
Abstract
By combining the chemical specificity afforded by infrared spectroscopy with the spatial resolution of an
optical microscope, infrared microspectroscopy has become a mainstay analytical tool in both academia and
industry. While applications abound in a wide variety of fields including chemistry, polymer science, material
science, forensic science, physics, art conservation and biology, the spatial resolution has remained limited to few
tens of microns. The high brightness (about three orders of magnitude) brings about by the use of a synchrotron
source compared to a thermal source, has opened widely the investigation domain, and the spatial resolution has
become diffraction limited. Two types of infrared sources, from a synchrotron radiation, have been identified, giving
roughly the same brightness advantage in the frequency region of interest in microscopy (2.5-40
m). The
potentiality of this analytical tool is documented in this article, in the study of individual human cells.
Combining X-ray microscopy and IR microscopy on the same sample location appears of great analytical potential,
and is illustrated in the case of human hair study.
© EDP Sciences 2003