J. Phys. IV France
Volume 104, March 2003
Page(s) 329 - 332

J. Phys. IV France
104 (2003) 329
DOI: 10.1051/jp4:200300092

X-ray micro-diffraction analysis of reconstructed bone at Zr prosthetic surface with sub-micrometer spatial resolution

A. Cedola1, V. Stanic2, M. Burghammer3, S. Lagomarsino1, F. Rustichelli4, R. Giardino5, N. Nicoli Aldini6, M. Fini6 and S. Di Fonzo7

1  Istituto di Fotonica e Nanotecnologie-CNR, V. Cineto Romano 42, 00156 Roma, Italy
2  Dipartimento di Fisica e Ingegneria dei Materiali e del Territorio, Università di Ancona, INFM-Unità di Ancona, Via Brecce Bianche, 60131 Ancona, Italy
3  ESRF, BP. 220, 38043 Grenoble cedex, France
4  Institute of Physical Sciences, University of Ancona, via Ranieri 65, 60131 Ancona, Italy
5  Chair of Surgical Pathophysiology, University of Bologna Medical School, Bologna, Italy
6  Experimental Surgery Department, Research Institute Codivilla Putti-Rizzoli Orthopaedic Institute, via di Barbiano 1/10, 40136 Bologna, Italy
7  Sincrotrone Trieste, S.S. 14 km 163.5 in Area Science Park, 34012 Basovizza (Trieste), Italy

The purpose of this paper is to study the structural properties of the reconstructed bone around a prosthetic device with submicrometer spatial resolution. In particular the X-ray technique illustrated here allows to study the interface between a Zr prosthetic device and the new formed bone. The interface region formed between the device and the bone, is analysed with a spatial resolution of 0.5 micron. Obtained results gave interesting information on Zr deformation and on crystallographic phase, grain size and texture of the bone which starts to grow in this region. From the study it appears evident a marked difference in the structure of reconstructed bone with respect to the native one.

© EDP Sciences 2003