J. Phys. IV France
Volume 104, March 2003
Page(s) 63 - 66

J. Phys. IV France
104 (2003) 63
DOI: 10.1051/jp4:200300030

The X-ray microscopy project at Saga SLS

M. Yasumoto1, E. Ishiguro2, K. Takemoto3, T. Tomimasu4, H. Kihara3, N. Kamijo3, T. Tsurushima5, A. Takahara6, K. Hara7 and Y. Chikaura8

1  Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan
2  College of Education, University of the Ryukyus, Okinawa 903-0213, Japan
3  Department of Physics, Kansai Medical University, Hirakata 573-1136, Japan
4  Saga Synchrotron Light Source, Saga Prefectural Government, Saga 840-8570, Japan
5  Kumamoto Technopolis Foundation, Kumamoto 861-2202, Japan
6  Institute for Fundamental Research of Organic Chemistry, Kyushu University, Fukuoka 812-8581, Japan
7  Institute of Environmental Systems, Faculty of Engineering, Kyushu University, Fukuoka 812-8581, Japan
8  Faculty of Engineering, Kyushu Institute of Technology, Fukuoka 804-8550, Japan

A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochorometer (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ~70 nm, the monochromaticity is ~2000, and the photon flux is $10^9\sim 10^{10}$ photons/sec.

© EDP Sciences 2003