J. Phys. IV France 104 (2003) 63
DOI: 10.1051/jp4:200300030

The X-ray microscopy project at Saga SLS

M. Yasumoto¹, E. Ishiguro², K. Takemoto³, T. Tomimasu⁴, H. Kihara³, N. Kamijo³, T. Tsurushima⁵, A. Takahara⁶, K. Hara⁷ and Y. Chikaura<sup>8

1</sup>  Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan
²  College of Education, University of the Ryukyus, Okinawa 903-0213, Japan
³  Department of Physics, Kansai Medical University, Hirakata 573-1136, Japan
⁴  Saga Synchrotron Light Source, Saga Prefectural Government, Saga 840-8570, Japan
⁵  Kumamoto Technopolis Foundation, Kumamoto 861-2202, Japan
⁶  Institute for Fundamental Research of Organic Chemistry, Kyushu University, Fukuoka 812-8581, Japan
⁷  Institute of Environmental Systems, Faculty of Engineering, Kyushu University, Fukuoka 812-8581, Japan
⁸  Faculty of Engineering, Kyushu Institute of Technology, Fukuoka 804-8550, Japan

Abstract
A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochorometer (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ~70 nm, the monochromaticity is ~2000, and the photon flux is photons/sec.

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