Numéro |
J. Phys. IV France
Volume 12, Numéro 9, November 2002
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|
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Page(s) | 181 - 182 | |
DOI | https://doi.org/10.1051/jp4:20020390 |
J. Phys. IV France 12 (2002) Pr9-181
DOI: 10.1051/jp4:20020390
X-ray diffraction study of the transient structure of sliding charge density waves in NbSe 3
H. Requardt1, D. Rideau2, R. Danneau2, A. Ayari3, F. Ya Nad3, 4, J.E. Lorenzo5, P. Monceau3, R. Currat2, C. Detlefs1, D. Smilgies1 and G. Grubel11 ESRF, BP. 220, 38043 Grenoble cedex, France
2 ILL, BP. 156,38042 Grenoble cedex, France
3 CRTBT-CNRS, BP. 166, 38042 Grenoble cedex, France
4 Institute for Radioengineering and Electronics, Moscow, Russia
5 Laboratoire de Cristallographie, CNRS, BP. 166, 38042 Grenoble cedex, France
Abstract
We present high resolution X-ray diffraction measurements on NbSe
3 of the charge-density-wave (CDW)
relaxation from the deformation created by the sliding of the CDW. The data are taken in the temperature range
75 K
<
T
< 10
5 K in the upper-CDW phase of NbSe, and cover spatial positions up to
m from the current
contact. Convenient fits to the data are obtained by a stretched exponential decay profile yielding exponents
in
the range of 0.4-0.7 and relaxation time-scales
of the order of 1-150 ms. becoming faster with increasing sample
temperature and slowing down with increasing distance from the current contact.
© EDP Sciences 2002