| Numéro |
J. Phys. IV France
Volume 11, Numéro PR11, Décembre 2001
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
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| Page(s) | Pr11-319 - Pr11-323 | |
| DOI | https://doi.org/10.1051/jp4:20011152 | |
J. Phys. IV France 11 (2001) Pr11-319-Pr11-323
DOI: 10.1051/jp4:20011152
YBCO coated nickel-based tapes with various buffer layers
S. Donet1, F. Weiss1, J.P. Sénateur1, P. Chaudouet1, A. Abrutis2, A. Teiserskis2, Z. Saltyte2, D. Selbmann3, J. Eickemeyer3, O. Stadel4, G. Wahl4, C. Jimenez5 and U. Miller61 LMGP-ENSPG, Saint-Martin-d'Hères, France
2 Vilnius University, Department of General and Inorganic Chemistry, Vilnius, Lithuania
3 IFW, Dresden, Germany
4 IOPW, Braunschweig, Germany
5 J.I.P. ELEC, Meylan, France
6 PLANSEE GmbH, Munich, Germany
Abstract
Biaxially textured YBa2Cu3O7 (YBCO) thin films, yttria stabilized zirconia (YSZ) and yttria (Y2O3), CeO2 buffer layers were grown in situ on NiO/Ni based substrates by Pulsed Injection MOCVD (PICVD) using monoglyme solutions of β-diketonates (CU(thd)2, Ba(thd)2, Y(thd)3, Ce (thd)2, Zr(thd)4). High quality textured nickel oxide layers have been prepared by SOE (Surface Oxydation Epitaxy) following an optimized recrystallisation-oxidation process.Thin YSZ/Y2O3 biaxially textured buffer layers (thickness 200nm/200 nm) were deposited in a wide range of temperature (fiom 600°C to 800°C). Subsequent YBCO layers (thickness 750nm) on Ni/NiO/YSZ/Y2O3 were grown epitaxially (ω-scan of YBCO FWMH=5°) and exhibited critical current densities Jc ≥ 3.105A/cm2 with a critical temperature Tc=90K and ΔTC ≤ 1K. The best results were obtained for deposition temperatures of 600°C for YSZ, 675°C for Y2O3 and 800°C for YBCO.
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