Numéro
J. Phys. IV France
Volume 11, Numéro PR3, Août 2001
Thirteenth European Conference on Chemical Vapor Deposition
Page(s) Pr3-561 - Pr3-567
DOI https://doi.org/10.1051/jp4:2001371
Thirteenth European Conference on Chemical Vapor Deposition

J. Phys. IV France 11 (2001) Pr3-561-Pr3-567

DOI: 10.1051/jp4:2001371

Metal and oxide thin film MO CVD as a base for nanostructure and superlattice formation

V.V. Bakovets, N.V. Gelfond, V.N. Mitkin, T.M. Levashova, I.P. Dolgovesova, V.T. Ratushnjak and V.G. Martynets

Institute of Inorganic Chemistry, SB RAS, Av. Akademika Lavrent'eva 3, 630090 Novosibirsk, Russia


Abstract
Mechanism and kinetics of Ni, Cu and Y2O3 thin film deposition are considered. It is shown that the decomposition temperature of chelate compounds decreases in hydrogen atmosphere. The film deposition temperature decreasing is defined by catalytic reaction of dissociative adsorption of hydrogen molecules. Then hydrogen atoms react with precursor molecules. The temperature of Y2O3 film deposition from Y(III) β-diketonate reaches 500°C because the CVD process is produced in inert atmosphere. Use of H2O vapor addition to above mentioned CVD process permits to increase the precursor adsorption on the substrate surface and provides films with good electrical properties. All these principles can be used for nanostructure and superlattice formation by an adsorption CVD method.



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