7th International Conference on X-Ray Lasers

J. Phys. IV France 11 (2001) Pr2-533-Pr2-536
DOI: 10.1051/jp4:20012104

Measurement of the wavefront of XUV sources

S. Le Pape¹, Ph. Zeitoun¹, J.-F. Hergot², B. Carré², P. Dhez¹, M. François³, M. Idir¹, H. Merdji², D. Ros¹, A. Carillon¹ and P. Salières<sup>2

1</sup>  Laboratoire de Spectroscopie Atomique et Ionique, bâtiment 350, Université Paris-Sud, 91405 Orsay, France
²  CEA, SPAM/DSM, Centre d'Étude de Saclay, 91191 Gif-sur-Yvette, France
³  Institut d'Électronique et de Microélectronique du Nord, Université des Sciences et Technologie de Lille, avenue Poincaré, BP. 69, 59652 Villeneuve-d'Ascq, France

Abstract
New fields of x-ray sources applications (x-ray laser and High Order Harmonic Generation) could appear if an intensity higher than 10¹² Wcm^-2 is reached. Following this goal, we have started a complete investigation of the x-ray beam wavefront both numerically and experimentally. The first xuv wavefront sensor has been developed and tested on different xuv sources For a better comprehension of the experimental results, a numerical work (ray-trace code) has been performed meanwhile. We will present and discuss the first results obtained on the x-ray laser at 21.2 nm.

© EDP Sciences 2001