| Numéro |
J. Phys. IV France
Volume 09, Numéro PR10, December 1999
International Workshop on Electronic CrystalsECRYS-99 |
|
|---|---|---|
| Page(s) | Pr10-289 - Pr10-291 | |
| DOI | https://doi.org/10.1051/jp4:19991075 | |
International Workshop
on Electronic Crystals
ECRYS-99
J. Phys. IV France 09 (1999) Pr10-289-Pr10-291
DOI: 10.1051/jp4:19991075
1 Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-85777, Japan
2 CREST, Japan Science and Technology Corporation (JST), Japan
3 Institute of Radio-Engineering and Electronics RAS, Mokhovaya 11, Moscow 103907, Russia
© EDP Sciences 1999
ECRYS-99
J. Phys. IV France 09 (1999) Pr10-289-Pr10-291
DOI: 10.1051/jp4:19991075
Charge solitons in layered superconductors
Yu.I. Latyshev1, 2, 3 and T. Yamashita1, 21 Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-85777, Japan
2 CREST, Japan Science and Technology Corporation (JST), Japan
3 Institute of Radio-Engineering and Electronics RAS, Mokhovaya 11, Moscow 103907, Russia
Abstract
We studied the interlayer tunneling in Bi-2212 stacks with in plane size variation down to submicron size. For submicron junctions we found experimental evidence of Coulomb charging effcts. The Coulomb blockade leads to the drop down of the Josephson critical current density and to appearance of periodic Coulomb staircase structure of current peaks on the IV characteristics. The period of the structure corresponds to the charge energy of the single Cooper pair charge soliton including the total number of the elementary junctions in the stack (~ 50). We analyzed conditions of the existence of charging effects in layered high-Tc materials of Bi-2212 type.
© EDP Sciences 1999