J. Phys. IV France
Volume 08, Numéro PR3, June 1998
Proceedings of the 3rd European Workshop on Low Temperature Electronics
Page(s) Pr3-275 - Pr3-278
Proceedings of the 3rd European Workshop on Low Temperature Electronics

J. Phys. IV France 08 (1998) Pr3-275-Pr3-278

DOI: 10.1051/jp4:1998361

X-ray response of Nb-based superconducting tunnel junction

R. Cristiano1, E. Esposito1, L. Frunzio1, S. Pagano1, A. Barone2, L. Parlato2, G. Peluso2, G. Pepe2, A. Esposito3, M. Aoyagi3, H. Akoh3, H. Nakagawaa3 and S. Takada3

1  Istituto di Cibernetica del CNR, Via Toiano 6, 80072 Arco Felice, Napoli, Italy
2  Dipartimento di Scienze Fisiche, Università di Napoli Federico II, P.le Tecchio 80, 80100 Napoli, Italy
3  Eletrotechnical Laboratory, 1-1-4 Umezono, Ibaraki 305, Tsukuba, Japan

Josephson tunnel junctions are well known as low temperature electronics devices. However, they are also important as very powerful sensors. A novel class of sensors is constituted by radiation detectors based on superconducting tunnel junctions, which could lead in next future to an advanced instrumentation with an interesting applicative future. So far this area is restricted to low-temperature superconductors. Several superconducting materials have been considered. Among them, Niobium is very attractive because of its highest critical temperature Tc. We have measured detailed X-ray detection characteristics for Nb-based tunnel junction made with different fabrication processes. We will discuss the difference in the X-ray response in terms of the relevant junction's parameters, underlying the problems of the niobium as suitable material for this kind of device.

© EDP Sciences 1998