Numéro |
J. Phys. IV France
Volume 08, Numéro PR3, June 1998
Proceedings of the 3rd European Workshop on Low Temperature ElectronicsWOLTE 3 |
|
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Page(s) | Pr3-259 - Pr3-262 | |
DOI | https://doi.org/10.1051/jp4:1998357 |
Proceedings of the 3rd European Workshop on Low Temperature Electronics
WOLTE 3
J. Phys. IV France 08 (1998) Pr3-259-Pr3-262
DOI: 10.1051/jp4:1998357
1 IESS-CNR, Via Cineto Romano 42, 00156 Roma, Italy
2 Università dell'Aquila, Monteluco di Roio, 67040 L'Aquila, Italy
3 Università di Roma La Sapienza, Piazzale A. Moro 5, 00185 Roma, Italy
© EDP Sciences 1998
WOLTE 3
J. Phys. IV France 08 (1998) Pr3-259-Pr3-262
DOI: 10.1051/jp4:1998357
Submicron superconductor-insulator-normal tunnel junctions for self-refrigerating bolometers
R. Leoni1, G. Arena1, P. Carelli2, M.G. Castellano1, F.V. Greco1, F. Melchiorri3 and G. Torrioli.11 IESS-CNR, Via Cineto Romano 42, 00156 Roma, Italy
2 Università dell'Aquila, Monteluco di Roio, 67040 L'Aquila, Italy
3 Università di Roma La Sapienza, Piazzale A. Moro 5, 00185 Roma, Italy
Abstract
We report on measurements on superconductor-insulator-normal tunnel junctions at temperatures below 1K. The junctions have been fabricated by shadow mask technique and e-beam lithography and have submicron dimensions. The measurements on our junctions show that their characteristics are very sensitive to temperature changes making them suitable for sensing temperature in a bolometer. Measurements on arrays of junctions designed to test the on chip electronic refrigeration will be also shown.
© EDP Sciences 1998