| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-247 - C2-248 | |
| DOI | https://doi.org/10.1051/jp4/1997184 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-247-C2-248
DOI: 10.1051/jp4/1997184
Department of Physics, Simon Fraser University, Burnaby, BC Canada V5A 1S6
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-247-C2-248
DOI: 10.1051/jp4/1997184
Glancing Angle EXAFS of Ultra Thin Films : Negligible Anomalous Dispersion Effects
D.T. Jiang and E.D. CrozierDepartment of Physics, Simon Fraser University, Burnaby, BC Canada V5A 1S6
Abstract
Anomalous dispersion effects distort the EXAFS interference functions obtained at glancing angles of incidence. It is
shown that the distortions in the amplitude and phase shift are strongly dependent on the thickness of the sample layer in a multilayer
system. For thick films (several hundred Å or more) our results are in good agreement with previous results in the literature. For
ultrathin samples (several atomic layers thick) we show that the distortions become negligibly small. Our calculations are confirmed
with experiment for a 8 monolayer bet Cu film grown on a Ag(00l) substrate.
© EDP Sciences 1997