| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|
|---|---|---|
| Page(s) | C2-243 - C2-244 | |
| DOI | https://doi.org/10.1051/jp4/1997182 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-243-C2-244
DOI: 10.1051/jp4/1997182
Thin Films Division, Materials Science Department, Technical University Darmstadt, Petersenstr 23 64287 Darmstadt, Germany
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-243-C2-244
DOI: 10.1051/jp4/1997182
XAFS - A Data Analysis Program for Materials Science
M. WintererThin Films Division, Materials Science Department, Technical University Darmstadt, Petersenstr 23 64287 Darmstadt, Germany
Abstract
A new program is presented for the data analysis of XAFS. Comprehensive methods are available for the analysis
of disordered systems.
© EDP Sciences 1997