| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-211 - C2-212 | |
| DOI | https://doi.org/10.1051/jp4/1997166 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-211-C2-212
DOI: 10.1051/jp4/1997166
1 Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin-Dahlem Germany
2 Department of Physics, Uppsala University, Box 530, 75121 Uppsala, Sweden
3 Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14 14195 Berlin-Dahlem Germany
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-211-C2-212
DOI: 10.1051/jp4/1997166
Surface Atomic-XAFS for Nitrogen Atoms on Copper
H. Wende1, D. Arvanitis2, M. Tischer1, R. Chauvistré1, H. Henneken1, F. May3 and K. Baberschke11 Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin-Dahlem Germany
2 Department of Physics, Uppsala University, Box 530, 75121 Uppsala, Sweden
3 Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14 14195 Berlin-Dahlem Germany
Abstract
The presence of oscillatory structures in the atomic x-ray absorption background is reported for the first time for
surface EXAFS of c(2x2)N/Cu(100) and (2x3)N/Cu(110). The experimental data for N/Cu(110) are compared to FEFF7
calculations of the oscillating atomic background µ0(E). For the two systems it is found that the AXAFS peak in the Fourier
transform increases by a factor of two as the N-atom is adsorbed closer to the surface plane.
© EDP Sciences 1997