J. Phys. IV France
Volume 7, Numéro C2, Avril 1997Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|Page(s)||C2-761 - C2-762|
J. Phys. IV France 7 (1997) C2-761-C2-762
Polarization and Geometry in the n-Site DAFS ProblemJ.O. Cross1, J.J. Rehr2 and L.B. Sorensen2
1 Naval Research Laboratory, Washington DC 20375, U.S.A.
2 Department of Physics, Box 351560, University of Washington, Seattle, WA 98195, U.S.A.
The use of diffraction anomalous fine-structure (DAFS) as a means to isolate site-specific XAFS-like response functions in low symmetry materials requires careful consideration of the polarization dependence of the anomalous scattering amplitudes. Starting from the second order matrix elements that describe the anomalous scattering, we use the Rehr-Albers scattering matrix formalism to describe the most general DAFS polarization tensor and make several conclusions about the polarization dependence of DAFS. In this short report, we limit our discussion to practical issues of experimental geometry for the case of DAFS from a material with multiple inequivalent sites in the unit cell.
© EDP Sciences 1997