Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-153 - C2-154
DOI https://doi.org/10.1051/jp4/1997147
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-153-C2-154

DOI: 10.1051/jp4/1997147

Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories

S.L.M. Schroeder1, 2

1  Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, UK
2  Fritz-Haber-Institut der Max-Planck-Gesellschaft, Abt. Anorganische Chemie Faradayweg 4-6, 14195 Berlin (Dahlem), Germany


Abstract
The signal formation in total electron-yield (TEY) XAS has been modelled for keV absorption edges using a computationally fast Monte-Carlo algorithm for the simulation of the Auger electron trajectories. It is shown that a pure KLL Auger-yield model achieves good agreement with experimental data for the K-edge TEY attenuation in Al and Cu. Advantages of the Monte-Carlo simulation approach over empirical and analytical models for the TEY are pointed out.



© EDP Sciences 1997