| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-581 - C2-582 | |
| DOI | https://doi.org/10.1051/jp4/1997104 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-581-C2-582
DOI: 10.1051/jp4/1997104
1 CRISMAT-ISMR.4, 14050 Caen cedex, France
2 CMPL, University of Rajasthan, Jaipur, India
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-581-C2-582
DOI: 10.1051/jp4/1997104
XPS Studies of Single Crystals of Bi-2212, Tl-2212 and Tl-2223
B.R. Sekhar1, F. Studer1, C. Martin1, P. Srivastava2 and K.B. Garg21 CRISMAT-ISMR.4, 14050 Caen cedex, France
2 CMPL, University of Rajasthan, Jaipur, India
Abstract
High quality single crystals of Bi-2212, Tl-2212 and Tl-2223 were studied using X-ray photoelectron
spectroscopy. From a deconvolution of the Cu2p3/2 main line, we have shown that the density of O 2p holes in the Cu-O
planes are qualitatively similar in case of the Bi and Tl-2212 systems even though they have shown many other differences
in their electronic structure properties. Also the results show a dependence of the density of holes on the number of Cu-O
planes as we go from Tl-2212 to Tl-2223.
© EDP Sciences 1997