| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-573 - C2-574 | |
| DOI | https://doi.org/10.1051/jp4/1997100 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-573-C2-574
DOI: 10.1051/jp4/1997100
1 Institute of Physics, Rostov State University, 5 Zorge Str., 344090 Rostov-on-Don, Russia
2 I. Physikalisches Institut der Universitaet Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, Germany
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-573-C2-574
DOI: 10.1051/jp4/1997100
Extended Energy Loss Fine Structure above Sub Valence Edges of the First-Transition Row Atoms and Germanium
A. I. Taranukhina1, R. V. Vedrinskii1, L. A. Bugaev1, V. L. Kraizman1, C. Wendland2, D. Hasselkamp2 and A. Scharmarn21 Institute of Physics, Rostov State University, 5 Zorge Str., 344090 Rostov-on-Don, Russia
2 I. Physikalisches Institut der Universitaet Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, Germany
Abstract
Extended energy loss fine structure (EELFS) above the M2,3-edge of amorphous Ge was measured and
evaluated in the previously developed calculational scheme taking into account the 3p- and 3d-ionization channels.
The 3d-ionization contribution is prevalent in the EELFS spectrum of Ge in contrast with the case of EELFS for
3d-transition metals. The influence of both plasmon excitations and 3p-spin-orbit splitting on EELFS was considered.
The excellent agreement of the experimental and theoretical results confirms the possibility of the nearest neighbour
distance determination with high accuracy by shallow level EELFS technique.
© EDP Sciences 1997