| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-713 - C2-714 | |
| DOI | https://doi.org/10.1051/jp4:1997216 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-713-C2-714
DOI: 10.1051/jp4:1997216
1 National Research Institute for Metals, 1-2-1 Sengen, Tsukuba, Ibaraki 305, Japan
2 Photon Factory, 1-1 Oho, Tsukuba, Ibaraki 305, Japan
3 National Institute of Health Sciences, 1-18-1 Kamiyoga, Setagaya, Tokyo 158, Japan
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-713-C2-714
DOI: 10.1051/jp4:1997216
Trace Chemical Characterization of Liquid Drop by Fluorescence Detection of Absorption Edge Shifts using Total Reflection Support
K. Sakurai1, A. Iida2 and H. Shintani31 National Research Institute for Metals, 1-2-1 Sengen, Tsukuba, Ibaraki 305, Japan
2 Photon Factory, 1-1 Oho, Tsukuba, Ibaraki 305, Japan
3 National Institute of Health Sciences, 1-18-1 Kamiyoga, Setagaya, Tokyo 158, Japan
Abstract
An analytical technique to investigate the chemical state of trace metals in a small amount of sample has been proposed. While the principle for distinguishing the chemical state is based on well known X-ray spectroscopic phenomena, i.e., chemical shifts of the absorption edges, a total reflection mirror has been employed as a support to enhance the signal to background ratio through the reduction of scattering X-ray background. The present paper describes the details of the analytical procedure and shows the successful results of the near edge absorption spectrum of trace iron (~ mM) in a wet liquid drop (~ µl) measured in 3 ~ 5 min. The feasibility of the application to biomedical science is also mentioned.
© EDP Sciences 1997