| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-477 - C2-479 | |
| DOI | https://doi.org/10.1051/jp4/1997059 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-477-C2-479
DOI: 10.1051/jp4/1997059
Department of Chemistry, University of Western Ontario, London N6A 5B7, Canada
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-477-C2-479
DOI: 10.1051/jp4/1997059
M3,2-Edge X-Ray Absorption Near Edge Structure of 5d Metals
T.K. Sham, I. Coulthard and S.J. NaftelDepartment of Chemistry, University of Western Ontario, London N6A 5B7, Canada
Abstract
We report M3,2 edge XANES measurements for a series of 5d metals, Hf, Ta, W, Re, Ir, Pt and Au using a total electron yield
technique. It was found that the M3,2 XANES for most 5d metals exhibit intense resonances at the threshold (whitelines). The area under
the whitetine correlates with the unoccupied densities of d states of the metal. The M3,2 XANES features and their systematic are
comparable to their L3,2 counterparts. These results clearly suggest that M3,2 edge XANES can be ased as an alternative probe to the
conventional L3,2 -edge XANES for the unoccupied densities of d states of the 5d metals and their compounds.
© EDP Sciences 1997