| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-707 - C2-708 | |
| DOI | https://doi.org/10.1051/jp4:1997213 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-707-C2-708
DOI: 10.1051/jp4:1997213
Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf, Universitätsstrasse 1, 40225 Düsseldorf, Germany
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-707-C2-708
DOI: 10.1051/jp4:1997213
Near Range Order Structural Information of Anodic Silver Oxide Layers by Means of Reflectivity Fine Structure Data Evaluation
D. Hecht, P. Borthen and H.-H. StrehblowInstitut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf, Universitätsstrasse 1, 40225 Düsseldorf, Germany
Abstract
Silver oxide (Ag2O and AgO) layers were prepared by the anodic oxidation of silver metal in 1M NaOH and investigated in situ with XAFS at grazing incidence. For given glancing angles, x-ray absorption fine structure spectra of the anodic oxides were extracted from these reflectivity data. The evaluation of these absorption data yields detailed near range order structural information about the electrochemically prepared oxides.
© EDP Sciences 1997