| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-341 - C2-342 | |
| DOI | https://doi.org/10.1051/jp4/1997012 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-341-C2-342
DOI: 10.1051/jp4/1997012
1 European Synchrotron Radiation Facility (ESRF), BP. 220, 38043 Grenoble, France
2 Université Joseph Fourier, Grenoble, France
3 European Synchrotron Radiation Facility (ESRF), BP. 220, 38043 Grenoble France
4 SESO, Pôle d'Activités d'Aix-les-Milles, BP. 55000, 13792 Aix-en-Provence, France
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-341-C2-342
DOI: 10.1051/jp4/1997012
Vertically Focusing Double Mirror Device (VF-2M) for the ESRF Beamline ID12A
R. Signorato1, C. Goulon-Ginet1, 2, J. Goulon1, A. Rogalev1, Ph. Marion3 and J.-J. Fermé41 European Synchrotron Radiation Facility (ESRF), BP. 220, 38043 Grenoble, France
2 Université Joseph Fourier, Grenoble, France
3 European Synchrotron Radiation Facility (ESRF), BP. 220, 38043 Grenoble France
4 SESO, Pôle d'Activités d'Aix-les-Milles, BP. 55000, 13792 Aix-en-Provence, France
Abstract
A double mirror device (VF-2M) has been inserted in the monochromatic section of the ESRF
beamline (BL) ID12A. It is aimed at refocusing the beam vertically very near the sample location and uses
two identical bulk CVD SiC bendable mirrors in an antiparallel configuration. The benders are actuated by
two UHV compatible digital piezo devices with nanometric precision (Queensgate Instruments Ltd.). The
first commissioning tests at BL ID12A revealed an excellent agreement between ray-tracing predictions and
experimental data. Vertical focus sizes as small as 22 um FWHM have been obtained. The measured
reflectivity is very close to calculated values, too.
© EDP Sciences 1997