Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-675 - C2-677
DOI https://doi.org/10.1051/jp4:1997202
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-675-C2-677

DOI: 10.1051/jp4:1997202

Growth Kinetics of Cu Clusters on a α-Al2O3 Surface Studied by SEXAFS

S. Gota1, M. Gautier-Soyer1, L. Douillard1, J.P. Duraud2 and P. Le Fèvre3

1  CEA, DSM/DRECAM/SRSIM, CEA Saclay, 91191 Gif-sur-Yvette, France
2  Laboratoire Pierre Süe, CEA-CNRS, CEA Saclay, 91191 Gif-sur-Yvette, France
3  Laboratoire pour l'Utilisation du Rayonnement Électromagnétique, bâtiment 209d, 91405 Orsay, France


Abstract
We show that SEXAFS can be used to determine the growth law of subnanometric particles. In the case of copper deposited on alumina, the dynamic scaling of the mean cluster size distribution, in the radius range 2-10 Å, is demonstrated. This scaling is explained by the coalescence of copper clusters, as in breath figures due to the condensation of liquid droplets. This growth law can be fitted by a power law with an exponent 1.2 and is fairly well reproduced by a purely stochastic coalescence model.



© EDP Sciences 1997