J. Phys. IV France
Volume 06, Numéro C4, Juillet 1996
Rayons X et Matiére
100 ans déjà ...
Page(s) C4-781 - C4-788
Rayons X et Matiére
100 ans déjà ...

J. Phys. IV France 06 (1996) C4-781-C4-788

DOI: 10.1051/jp4:1996476

Applications of an Integrated XRF-XRD Spectrometer

R. Yellepeddi, A. Bapst and D. Bonvin

ARL, En Vallaire, 1024 Ecublens, Switzerland

An X-ray spectrometer which effectively integrates X-ray fluorescence and X-ray diffraction in a single instrument has been developed. The instrument uses same X-ray excitation, sample position, vacuum tank and control systems for both XRF and XRD measurements. It is shown that flexible elemental analysis together with specific phase/compound analysis can be accomplished in a quantitative way using such an instrument. Various applications in industrial process and quality control are illustrated.

© EDP Sciences 1996