Numéro |
J. Phys. IV France
Volume 06, Numéro C3, Avril 1996
WOLTE 2Proceedings of the Second European Workshop on Low Temperature Electronics |
|
---|---|---|
Page(s) | C3-219 - C3-224 | |
DOI | https://doi.org/10.1051/jp4:1996333 |
Proceedings of the Second European Workshop on Low Temperature Electronics
J. Phys. IV France 06 (1996) C3-219-C3-224
DOI: 10.1051/jp4:1996333
Cryo-MOSFET and IGBT : a Comparison
O. MuellerAmerican Superconductor Corporation, 2 Technology Drive, Westborough, MA 01581, U.S.A.
Abstract
The preferred device for power eletronics in the multi-kilowatt /300-1000 V range is today the IGBT (Insulated Gate Bipolar Transistor). It may in the near future see an emerging strong competitor for certain suitable applications : The Cryo-MOSFET. This paper compares the main properties of these two devices. It demonstrates that the Cryo-MOSFET in combination with high-temperature superconductors (HTS) can do to the field of power electronics what integrated circuit (IC) technology has done to the computer and communication industry : The ultimate in size, weight and cost reduction. The Cryo-MOS technology is based on the fact that the on-resistance of high-voltage devices decreases dramatically at cryogenic temperatures. This is due to the majority carrier mobility increase in the drain-source drift region. The on-state conduction losses in high-power switch-mode circuits can then be made as small as desirable by paralleling, because MOSFETs as ohmic devices do not exhibit an on-state threshold voltage as the IGBT, the MCT, the GTO, etc.
© EDP Sciences 1996